January 12, 2018

#IOTFRIDAY E16 | Discussing CES 2018

BY :     January 12, 2018

The year 2018 starts with the big Consumer electronics show in Las Vegas: CES 2018. #IoTFriday takes a look on what trends can be discovered. We group the new introductions on CES2018 by technology. When there is no black out we read all the news and the first #IoTFriday of 2018 is reserved for a bit of nerd talk.

Our resolutions with #IoTFriday for 2018 are:

  • great discussions on IoT trends,
  • discus new technology,
  • bring more details on IoT solutions,
  • and more interaction with our audience on what to tackle in the next episodes of #IoTFriday.

Because…every day can be #IoTFriday 🙂

Tom Van de Ven

About

Tom van de Ven is active in the field of High Tech testing for 15 years. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to starting/professionalizing test projects. Besides a multitude of test assignments (eg. in the field of healthcare, semiconductors, agriculture and automotive) he is an active member of the Sogeti High Tech Test Competence Centre and a speaker for High Tech seminars. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He is the author of the book that combines Internet of Things and TMap: IoTMap!!!. He also teaches and develops several testing courses in the embedded and high tech domain. If not teaching, testing a tunnel or promoting “Quick Tech Testing” you can find him setting up a high tech test automation framework for the odd customer.

More on Tom Van de Ven.

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*Opinions expressed on this blog reflect the writer’s views and not the position of the Sogeti Group