#IoTFriday E27 | Testing in the Digital Age
#IoTFriday E27 | Testing in the Digital Age
BY : Tom Van de Ven
The digital age brings more than only paper to mobile conversion. Processes are improved by digital, collecting data, using models and being predictive. Testing is a reactive activity. To become predictive we need 5 steps to create roadmap. A new book is released on the 1st of June 2018 in Utrecht, The Netherlands: “Testing in the digital age; AI makes the difference”. IoT contributes greatly to the digital age and everything we need for testing to grow to a situation where we do quality predictions just like weather forecasters.
About Tom Van de Ven
Tom van de Ven is active in the field of High Tech testing for 15 years. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to starting/professionalizing test projects. Besides a multitude of test assignments (eg. in the field of healthcare, semiconductors, agriculture and automotive) he is an active member of the Sogeti High Tech Test Competence Centre and a speaker for High Tech seminars. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He is the author of the book that combines Internet of Things and TMap: IoTMap!!!. He also teaches and develops several testing courses in the embedded and high tech domain. If not teaching, testing a tunnel or promoting “Quick Tech Testing” you can find him setting up a high tech test automation framework for the odd customer.
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