Today we are at the booklaunch of “Testing in the digital age; AI makes the difference”. Tom is the author of this book and we meetup with another author Rik Marselis. At the end of todays #IoTFriday we wrap up with a animation that summarizes everything for you. The book is now available to order of course!
Testing in the digital age brings a new vision on test engineering, using new quality attributes that tackle intelligent machines and a roadmap split up in five hops. With everything digital there are more possibilities for test automation and piles of (test) data growing out of control. Working together with robots (cobotics), using artificial intelligence in testing and eventually predict the occurrence of defects brings your testing to the digital age. We have interviewed companies on their view of digital testing. A glossary brings an extensive list of terms that supports you in all your test communications.
About Tom Van de Ven
Tom van de Ven is active in the field of High Tech testing for 15 years. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to starting/professionalizing test projects. Besides a multitude of test assignments (eg. in the field of healthcare, semiconductors, agriculture and automotive) he is an active member of the Sogeti High Tech Test Competence Centre and a speaker for High Tech seminars. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He is the author of the book that combines Internet of Things and TMap: IoTMap!!!. He also teaches and develops several testing courses in the embedded and high tech domain. If not teaching, testing a tunnel or promoting “Quick Tech Testing” you can find him setting up a high tech test automation framework for the odd customer.
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