#IoTFriday E14 | Analyse IoT Data and Use Machine Learning to Create Information


Think is the crucial part of an IoT solution. It gives information to acting towards end users. The added value of IoT solutions is found in the information created by the Think part. It is vital to think about what information is needed. This creates the source for what information needs to be gathered from the things. It also gives insight into what other data is needed for enrichment. This in order delivers the added information value and act action of the full IoT solution,

Today #IoTFriday brings to you Think of the CTTA model. Tom and Steven go over different types of data that can be collected. It also gives insight into the use of machine learning and further activities.

Tom Van de Ven


Tom van de Ven is active in the field of High Tech testing for 15 years. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to starting/professionalizing test projects. Besides a multitude of test assignments (eg. in the field of healthcare, semiconductors, agriculture and automotive) he is an active member of the Sogeti High Tech Test Competence Centre and a speaker for High Tech seminars. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He is the author of the book that combines Internet of Things and TMap: IoTMap!!!. He also teaches and develops several testing courses in the embedded and high tech domain. If not teaching, testing a tunnel or promoting “Quick Tech Testing” you can find him setting up a high tech test automation framework for the odd customer.

More on Tom Van de Ven.

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