It is #IoTFriday and the digital twin is our topic. A digital twin is a digital representation of a solution (physical device/service). It is made up of information from the existing physical product, sensor data, real-time data, predictions and/or manufacturing data. The digital twin can be used throughout the entire product life cycle.
We look at the effects of NOT using a digital twin in the different phases of the product life cycle. Consequences are felt throughout all phases and we conclude that we actually cannot do without the digital twin. The input and output of a digital twin is data and we find three types of data to be used: customer data, business data and diagnostic or development data.
Keep watching #IoTFriday and bring on new topics!
About Tom Van de Ven
Tom van de Ven is active in the field of High Tech testing for 15 years. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to starting/professionalizing test projects. Besides a multitude of test assignments (eg. in the field of healthcare, semiconductors, agriculture and automotive) he is an active member of the Sogeti High Tech Test Competence Centre and a speaker for High Tech seminars. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He is the author of the book that combines Internet of Things and TMap: IoTMap!!!. He also teaches and develops several testing courses in the embedded and high tech domain. If not teaching, testing a tunnel or promoting “Quick Tech Testing” you can find him setting up a high tech test automation framework for the odd customer.
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